Class Overview
This class will present an overview of the test methods for counterfeit mitigation of electronic components. It will provide a brief overview of each of the following test methods: External Visual Inspection; X-Ray Fluorescence; Delid/Decapsulation Physical Analysis (DDPA); Radiological Inspection; Acoustic Microscopy and Electrical Test Methods.
In addition, test report content will be discussed as well as the role of in-house laboratories versus third party laboratories. The class includes images to help the attendee recognize the indicators of counterfeit or sub-standard electronic components.
Class Content
- Overview of Test
Methods
- External Visual Inspection
- X-Ray Fluoresence
- Delid/Decapsulation Physical Analysis (DDPA)
- Radiological Inspection
- Acoustic Microsopy
- Electrical Test Methods
- Flow of the testing
protocol
- Overview of Test
Reports
- Internal Labs versus Third Party
Labs
- Review of published standards for counterfeit
mitigation
Learning Objectives
- Understand the various testing protocol and terminology for counterfeit mitigation testing.
- Become familiar with the various test methods.
- Understand the flow of the testing
protocol.
- Understand the importance of the results and the report.
- Become aware of the published standards.
Industry Sectors:
Original Equipment Manufacturers (OEM), Independent Distributors, Government Agencies
Job Functions:
Quality, Purchasing, Management, Sales
Class Length:
1 hour
Class Tuition:
$225.00
ERAI Member Price:
$180.00