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Webinar - Should Your Organization Be Concerned About DFARS 252.246.7008 and the Supply Chain Impact Regarding Obsolete and Counterfeit Components?

Kristal Snider
04/03/2017

If your organization is currently faced with obsolescence and counterfeit detection and avoidance challenges, and are unaware of the recent DFARS announcement, or need help interpreting it, please join IEC Electronics and a team of experts to learn more about how this latest release could impact you and your organization.

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Creative Electron Acquires FocalSpot

Kristal Snider
04/21/2016

Creative Electron, Inc., a leading American manufacturer of x-ray inspection systems announced today the acquisition of the legacy MXI service business (including services for FocalSpot, Nicolet, and Faxitron* system brands) from Nordson-MatriX-FocalSpot.



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DoD Casts A Wide Net To Catch Counterfeit Parts; DFARS Case 2012-D055; Detection and Avoidance of Counterfeit Electronic Parts

Kristal Snider
11/12/2015

In the last few years there has been a flurry of legislative activity relative to counterfeit electronic parts in the DoD supply chain. In 2007 concerns were raised by the U.S. Department of the Navy, Naval Air Systems Command (NAVAIR) who asked the Bureau of Industry and Security’s (BIS) Office of Technology Evaluation (OTE) to conduct a defense industrial base assessment of counterfeit electronics. NAVAIR had reason to suspect an increasing number of counterfeit and defective electronics were entering the DoD supply chain, which would adversely impact weapon system reliability. NAVAIR’s suspicions were confirmed. The BIS study titled “Defense Industrial Base Assessment: Counterfeit Electronics” was published in January 2010. The report’s findings prompted a swift response from Senators Carl Levin and John McCain in March 2011 when they launched a deeper investigation into counterfeit electronics part activity via the Senate Armed Service Committee (SASC). In November 2011, the SASC held a hearing with DoD contractors, industry associations and others in Washington D.C. to explore the problem of counterfeit electronic parts infiltrating critical defense systems and the risk those parts pose to such systems.

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